INSITU CHARACTERIZATION OF POSITIVE RESIST DEVELOPMENT

被引:7
作者
OLDHAM, WG [1 ]
机构
[1] UNIV CALIF BERKELEY, ELECTR RES LAB, BERKELEY, CA 94720 USA
关键词
D O I
10.1117/12.7972320
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:59 / 62
页数:4
相关论文
共 5 条
[1]  
CANAVELLO BJ, 1977, IBM TECH DISCL B, V19, P4049
[2]   THERMAL EFFECTS ON PHOTORESIST AZ1350J [J].
DILL, FH ;
SHAW, JM .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1977, 21 (03) :210-218
[3]   CHARACTERIZATION OF POSITIVE PHOTORESIST [J].
DILL, FH ;
HORNBERGER, WP ;
HAUGE, PS ;
SHAW, JM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (07) :445-452
[4]   INSITU MEASUREMENT OF DIELECTRIC THICKNESS DURING ETCHING OR DEVELOPING PROCESSES [J].
KONNERTH, KL ;
DILL, FH .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (07) :452-456
[5]  
KONNERTH KL, 1976, ANNUAL REV MATER SCI, V6, P452