A WHITE-X-RAY 4-CIRCLE DIFFRACTOMETER

被引：9

作者：

SAKAMAKI, T ^{[1
]}

HOSOYA, S ^{[1
]}

FUKAMACHI, T ^{[1
]}

机构：

[1] SAITAMA INST TECHNOL,OKABE,SAITAMA 36902,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1980年 / 13卷 / OCT期

关键词：

D O I：

10.1107/S0021889880012496

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：433 / 437

页数：5

共 15 条

[1]

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[7] ESCAPE PEAKS CAUSED BY A GE(LI) DETECTOR IN AN ENERGY-DISPERSIVE DIFFRACTOMETER [J].

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[8] PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETER [J].

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JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (APR1) :117-122

[9] EQUIPPING A 4-CIRCLE SINGLE-CRYSTAL DIFFRACTOMETER WITH AN INTERCHANGEABLE SI(LI) SOLID-STATE DETECTOR [J].

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MITCHELL, RH .

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[10] APPLICATIONS OF A SOLID-STATE DETECTOR ON A MODERN SINGLE-CRYSTAL X-RAY DIFFRACTOMETER [J].

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