QUANTUM INTERFERENCE EFFECTS IN GAAS GAALAS BULK POTENTIAL BARRIERS

被引:24
作者
HAYES, JR
ENGLAND, P
HARBISON, JP
机构
关键词
D O I
10.1063/1.99086
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1578 / 1580
页数:3
相关论文
共 9 条
  • [1] ALLYN CA, 1980, APPL PHYS LETT, V36, P377
  • [2] ZUR BERECHNUNG DES TUNNELSTROMS DURCH EINE TRAPEZFORMIGE POTENTIALSTUFE
    GUNDLACH, KH
    [J]. SOLID-STATE ELECTRONICS, 1966, 9 (10) : 949 - &
  • [3] HOT-ELECTRON SPECTROSCOPY
    HAYES, JR
    LEVI, AFJ
    WIEGMANN, W
    [J]. ELECTRONICS LETTERS, 1984, 20 (21) : 851 - 852
  • [4] HOT-ELECTRON SPECTROSCOPY OF GAAS
    HAYES, JR
    LEVI, AFJ
    WIEGMANN, W
    [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (14) : 1570 - 1572
  • [5] HICKMONT TW, 1983, APPL PHYS LETT, V44, P90
  • [6] INJECTED-HOT-ELECTRON TRANSPORT IN GAAS
    LEVI, AFJ
    HAYES, JR
    PLATZMAN, PM
    WIEGMANN, W
    [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (19) : 2071 - 2073
  • [7] PLANAR-DOPED BARRIERS IN GAAS BY MOLECULAR-BEAM EPITAXY
    MALIK, RJ
    AUCOIN, TR
    ROSS, RL
    BOARD, K
    WOOD, CEC
    EASTMAN, LF
    [J]. ELECTRONICS LETTERS, 1980, 16 (22) : 836 - 837
  • [8] TUNNELING IN THIN MOS STRUCTURES
    MASERJIAN, J
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (06): : 996 - 1003
  • [9] MAJORITY-CARRIER CAMEL DIODE
    SHANNON, JM
    [J]. APPLIED PHYSICS LETTERS, 1979, 35 (01) : 63 - 65