TIP FINITE-SIZE EFFECTS ON ATOMIC-FORCE MICROSCOPY IN THE CONTACT MODE - SIMPLE GEOMETRICAL CONSIDERATIONS FOR RAPID ESTIMATION OF APEX RADIUS AND TIP ANGLE BASED ON THE STUDY OF POLYSTYRENE LATEX BALLS

被引:106
作者
ODIN, C [1 ]
AIME, JP [1 ]
ELKAAKOUR, Z [1 ]
BOUHACINA, T [1 ]
机构
[1] UNIV BORDEAUX 1,LCPC,351 COURS LIBERAT,F-33405 TALENCE,FRANCE
关键词
D O I
10.1016/0039-6028(94)90288-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Atomic force microscopy (AFM) has been developed as a tool for investigating any type of surface at an atomic scale. Since then, except for particular surfaces exhibiting an atomic roughness, we know that the finite size of the tip does not allow us to access at the whole structure of the surface. Moreover, the tip geometry radically modifies the range of the interactions. Therefore, even an approximate knowledge of the tip geometry is of particular importance. The aim of the present note is to provide a simple way to get the main parameters of a tip - its apex radius of curvature and the cone angle - by using a simple reference sample: latex balls. To do so, simple geometrical arguments are used, assuming that both the tip and the sample behave like hard samples, a reasonable assumption at a mesoscopic scale (tens of nanometres to micrometres). Using this simplifying assumption, we present a formula which could be used to rapidly evaluate the effect of the finite size of the apex of the tip in the formation of AFM images of simple objects: steps, isolated spheres or two-dimensional close-packed lattices of spheres, and cosinusoidal corrugations. Two types of tip geometry are presupposed: a conic tip truncated by a spherical apex or a parabolic tip. It is then shown that, in practice, latex balls can be used as a reference to estimate the radius of curvature of the apex, and the angle of the cone.
引用
收藏
页码:321 / 340
页数:20
相关论文
共 36 条
[1]   EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY [J].
ABRAHAM, FF ;
BATRA, IP ;
CIRACI, S .
PHYSICAL REVIEW LETTERS, 1988, 60 (13) :1314-1317
[2]  
AIME JP, IN PRESS J APPL PHYS
[3]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[4]  
BOISSET MC, IN PRESS MICROSC MIC
[5]   CIRCULAR DNA-MOLECULES IMAGED IN AIR BY SCANNING FORCE MICROSCOPY [J].
BUSTAMANTE, C ;
VESENKA, J ;
TANG, CL ;
REES, W ;
GUTHOLD, M ;
KELLER, R .
BIOCHEMISTRY, 1992, 31 (01) :22-26
[6]   SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY IN ORGANIC-CHEMISTRY [J].
FROMMER, J .
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 1992, 31 (10) :1298-1328
[7]   SIMPLE THEORY FOR THE ATOMIC-FORCE MICROSCOPE WITH A COMPARISON OF THEORETICAL AND EXPERIMENTAL IMAGES OF GRAPHITE [J].
GOULD, SAC ;
BURKE, K ;
HANSMA, PK .
PHYSICAL REVIEW B, 1989, 40 (08) :5363-5366
[8]   SCANNING PROBE METROLOGY [J].
GRIFFITH, JE ;
GRIGG, DA ;
VASILE, MJ ;
RUSSELL, PE ;
FITZGERALD, EA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04) :674-679
[9]   DIMENSIONAL METROLOGY WITH SCANNING PROBE MICROSCOPES [J].
GRIFFITH, JE ;
GRIGG, DA .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (09) :R83-R109
[10]   CHARACTERIZATION OF SCANNING PROBE MICROSCOPE TIPS FOR LINEWIDTH MEASUREMENT [J].
GRIFFITH, JE ;
GRIGG, DA ;
VASILE, MJ ;
RUSSELL, PE ;
FITZGERALD, EA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06) :3586-3589