GENERAL-ANALYSIS OF FRINGE CONTRAST IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引:31
作者
SLETTEMOEN, GA
机构
[1] Department of Physics, University of Trondheim, The Norwegian Institute of Technology, Trondheim NTH
来源
OPTICA ACTA | 1979年 / 26卷 / 03期
关键词
D O I
10.1080/713819989
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A general analysis of signal processing in electronic speckle pattern interferometry is presented. The effects of limited T.V.-camera resolution is included, and it is shown that the T.V.-monitor brightness is given by essentially the same expression as for full T.V.-camera resolution. One term in this expression is the fringe signal, while the others represent noise. The optimal reference-to-object intensity ratio, which maximizes the fringe signal, is determined and the dependence on the size of the aperture is given. The effect of a double slit aperture is compared with the effect of a circular aperture. © 1979 Taylor & Francis Group, LLC.
引用
收藏
页码:313 / 327
页数:15
相关论文
共 8 条
  • [1] BIBERMANN LM, 1971, PHOTOELECTRONIC IMAG, V1, P375
  • [2] BIEDERMANN K, 1975, ENGINEERING USES COH, P219
  • [3] DAVENPORT WB, 1958, RANDOM SIGNALS NOISE, P182
  • [4] FRINGE CONTRAST IN A SYSTEM FOR HOLOGRAM INTERFEROMETRY WITH LOW RESOLUTION IMAGING DEVICES
    EK, L
    BIEDERMANN, K
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (08): : 691 - 696
  • [5] Goodman JW, 1975, TOP APPL PHYS, V9, P9
  • [6] USE OF MODULATED REFERENCE WAVE IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, OJ
    HOGMOEN, K
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (10): : 847 - 851
  • [7] OPTIMAL SIGNAL-PROCESSING IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    SLETTEMOEN, GA
    [J]. OPTICS COMMUNICATIONS, 1977, 23 (02) : 213 - 216
  • [8] STETSON KA, 1969, OPTIK, V29, P386