共 8 条
- [1] BIBERMANN LM, 1971, PHOTOELECTRONIC IMAG, V1, P375
- [2] BIEDERMANN K, 1975, ENGINEERING USES COH, P219
- [3] DAVENPORT WB, 1958, RANDOM SIGNALS NOISE, P182
- [4] FRINGE CONTRAST IN A SYSTEM FOR HOLOGRAM INTERFEROMETRY WITH LOW RESOLUTION IMAGING DEVICES [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (08): : 691 - 696
- [5] Goodman JW, 1975, TOP APPL PHYS, V9, P9
- [6] USE OF MODULATED REFERENCE WAVE IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (10): : 847 - 851
- [8] STETSON KA, 1969, OPTIK, V29, P386