THERMAL VIBRATIONS IN SI STUDIED BY CHANNELING-RADIATION SPECTROSCOPY

被引：21

作者：

HAU, LV

LAEGSGAARD, E

ANDERSEN, JU

机构：

[1] Institute of Physics, University of Aarhus

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 48卷 / 1-4期

关键词：

12;

D O I：

10.1016/0168-583X(90)90113-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Spectroscopy of channeling radiation from 3.5 MeV electrons along a 〈111〉 axis in Si has been applied to derive effective Debye temperatures at room temperature and at 110 K. The results are in good agreement with values obtained from measurements of planar-channeling radiation at 54 MeV and with recent measurements of high-order Bragg reflection of X-rays, but they are inconsistent with determinations from Bragg scattering of neutrons. We obtain Debye temperatures of about 510 K, much lower than the standard value of 543 K usually applied for Si. © 1990.

引用

页码：244 / 247

页数：4

共 14 条

[1] ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J].

ALDRED, PJE ;

HART, M .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :223-+

[2] TEMPERATURE-DEPENDENCE OF AXIAL-CHANNELING RADIATION [J].

ANDERSEN, JU ;

LAEGSGAARD, E ;

SORENSEN, AH .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3) :63-66

[3]

ANDERSEN JU, 1987, NATO ASI B, V165, P163

[4] VIBRATIONAL AMPLITUDES IN GERMANIUM AND SILICON [J].

BATTERMAN, BW ;

CHIPMAN, DR .

PHYSICAL REVIEW, 1962, 127 (03) :690-&

[5] ELECTRONIC CHARGE-DISTRIBUTION IN SILICON [J].

DEUTSCH, M ;

HART, M .

PHYSICAL REVIEW B, 1985, 31 (06) :3846-3858

[6] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].

DOYLE, PA ;

TURNER, PS .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&

[7] DIRECT OBSERVATION OF TDS PROFILES FROM PERFECT SILICON SINGLE-CRYSTALS ON A NEUTRON DIFFRACTOMETER [J].

GRAF, HA ;

SCHNEIDER, JR ;

FREUND, AK ;

LEHMANN, MS .

ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (NOV) :863-871

[8]

HAU LV, 1989, THESIS U AARHUS

[9]

HAU LV, IN PRESS

[10]

LAEGSGAARD E, 1987, NATO ASI SER B-PHYS, V165, P227

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