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STRUCTURE OF SILICON MONOXIDE
被引:23
作者
:
LIN, SCH
论文数:
0
引用数:
0
h-index:
0
LIN, SCH
JOSHI, M
论文数:
0
引用数:
0
h-index:
0
JOSHI, M
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1969年
/ 116卷
/ 12期
关键词
:
D O I
:
10.1149/1.2411690
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1740 / +
页数:1
相关论文
共 7 条
[1]
A STUDY OF AMORPHOUS SIO
BRADY, GW
论文数:
0
引用数:
0
h-index:
0
BRADY, GW
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1959,
63
(07)
: 1119
-
1120
[2]
STRUCTURE OF SILICON OXIDE FILMS
COLEMAN, MV
论文数:
0
引用数:
0
h-index:
0
COLEMAN, MV
THOMAS, DJD
论文数:
0
引用数:
0
h-index:
0
THOMAS, DJD
[J].
PHYSICA STATUS SOLIDI,
1967,
22
(02):
: 593
-
&
[3]
ATOMIC STRUCTURE AND CORRELATION IN VITREOUS SILICA BY X-RAY AND NEUTRON DIFFRACTION
HENNINGE.EH
论文数:
0
引用数:
0
h-index:
0
HENNINGE.EH
BUSCHERT, RC
论文数:
0
引用数:
0
h-index:
0
BUSCHERT, RC
HEATON, L
论文数:
0
引用数:
0
h-index:
0
HEATON, L
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1967,
28
(03)
: 423
-
&
[4]
LIN SH, TO BE PUBLISHED
[5]
STRUCTURAL EVALUATION OF SILICON OXIDE FILMS
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(10)
: 1013
-
&
[6]
OPTICAL ABSORPTION IN SILICON MONOXIDE
RAWLINGS, IR
论文数:
0
引用数:
0
h-index:
0
RAWLINGS, IR
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1968,
1
(06)
: 733
-
&
[7]
SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION
WHITE, EW
论文数:
0
引用数:
0
h-index:
0
WHITE, EW
ROY, R
论文数:
0
引用数:
0
h-index:
0
ROY, R
[J].
SOLID STATE COMMUNICATIONS,
1964,
2
(06)
: 151
-
152
←
1
→
共 7 条
[1]
A STUDY OF AMORPHOUS SIO
BRADY, GW
论文数:
0
引用数:
0
h-index:
0
BRADY, GW
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1959,
63
(07)
: 1119
-
1120
[2]
STRUCTURE OF SILICON OXIDE FILMS
COLEMAN, MV
论文数:
0
引用数:
0
h-index:
0
COLEMAN, MV
THOMAS, DJD
论文数:
0
引用数:
0
h-index:
0
THOMAS, DJD
[J].
PHYSICA STATUS SOLIDI,
1967,
22
(02):
: 593
-
&
[3]
ATOMIC STRUCTURE AND CORRELATION IN VITREOUS SILICA BY X-RAY AND NEUTRON DIFFRACTION
HENNINGE.EH
论文数:
0
引用数:
0
h-index:
0
HENNINGE.EH
BUSCHERT, RC
论文数:
0
引用数:
0
h-index:
0
BUSCHERT, RC
HEATON, L
论文数:
0
引用数:
0
h-index:
0
HEATON, L
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1967,
28
(03)
: 423
-
&
[4]
LIN SH, TO BE PUBLISHED
[5]
STRUCTURAL EVALUATION OF SILICON OXIDE FILMS
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(10)
: 1013
-
&
[6]
OPTICAL ABSORPTION IN SILICON MONOXIDE
RAWLINGS, IR
论文数:
0
引用数:
0
h-index:
0
RAWLINGS, IR
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1968,
1
(06)
: 733
-
&
[7]
SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION
WHITE, EW
论文数:
0
引用数:
0
h-index:
0
WHITE, EW
ROY, R
论文数:
0
引用数:
0
h-index:
0
ROY, R
[J].
SOLID STATE COMMUNICATIONS,
1964,
2
(06)
: 151
-
152
←
1
→