DEPTH PROFILING OF ELASTIC STRAINS IN LATTICE-MISMATCHED SEMICONDUCTOR HETEROSTRUCTURES AND STRAINED-LAYER SUPERLATTICES

被引：74

作者：

OLEGO, DJ

SHAHZAD, K

PETRUZZELLO, J

CAMMACK, D

机构：

来源：

PHYSICAL REVIEW B | 1987年 / 36卷 / 14期

关键词：

D O I：

10.1103/PhysRevB.36.7674

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：7674 / 7677

页数：4

相关论文

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