KINEMATICAL SIMULATION OF HIGH-RESOLUTION X-RAY-DIFFRACTION CURVES OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICES - A STRUCTURAL ASSESSMENT

被引：30

作者：

VANDENBERG, JM

BEAN, JC

HAMM, RA

HULL, R

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 14期

关键词：

D O I：

10.1063/1.99189

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1152 / 1154

页数：3

共 19 条

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