TITANIUM CARBIDE RECTIFYING CONTACTS ON BORON-DOPED POLYCRYSTALLINE DIAMOND

被引:9
作者
TACHIBANA, T
GLASS, JT
THOMPSON, DG
机构
[1] N CAROLINA STATE UNIV,DEPT MAT SCI & ENGN,RALEIGH,NC 27695
[2] KOBE STEEL USA INC,CTR ELECTR MAT,RES TRIANGLE PK,NC 27709
关键词
D O I
10.1016/0925-9635(93)90139-S
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
TiC contacts on B-doped polycrystalline diamond were studied. The as-deposited TiC formed rectifying contacts with a reverse leakage current of 0.4 muA at 5 V. After the contacts had been annealed at 850-degrees-C at a vacuum of approximately 1 x 10(-8) Torr, the current-voltage (I-V) characteristics of the contacts changed little and the rectifying nature was retained. The primary observable change was that the leakage current at 5 V reverse bias increased from 0.4 to 0.7 muA. The thermal stability of the rectifying contacts was attributed to the chemically non-reactive interface between the diamond and TiC.
引用
收藏
页码:37 / 40
页数:4
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