RELATION BETWEEN GROWTH STRIATIONS AND RESISTIVITY VARIATIONS IN SILICON-CRYSTALS

被引：4

作者：

DEKOCK, AJR ^{[1
]}

SEVERIN, PJ ^{[1
]}

ROKSNOER, PJ ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1974年 / 22卷 / 01期

关键词：

D O I：

10.1002/pssa.2210220118

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：163 / 166

页数：4

相关论文

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