LOW TEMPERATURE, MM-WAVE CYCLOTRON RESONANCE RELAXATION TIMES IN SILICON

被引：16

作者：

HENSEL, JC

机构：

来源：

PHYSICS LETTERS | 1963年 / 4卷 / 01期

关键词：

D O I：

10.1016/0031-9163(63)90578-X

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：38 / 40

页数：3

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[1] CYCLOTRON RESONANCE OVER A WIDE TEMPERATURE RANGE .2. SILICON
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[8] MEASUREMENT OF ELASTIC CONSTANTS AT LOW TEMPERATURES BY MEANS OF ULTRASONIC WAVES - DATA FOR SILICON AND GERMANIUM SINGLE CRYSTALS, AND FOR FUSED SILICA
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[9] ON THE LOW TEMPERATURE LIMIT OF MM-WAVE CYCLOTRON RESONANCE LINE WIDTHS
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