ELECTRICAL-PROPERTIES OF PLATINUM-SILICON CONTACT ANNEALED IN AN H-2 AMBIENT

被引:31
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MUTA, H
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10.1143/JJAP.17.1089
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O59 [应用物理学];
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页码:1089 / 1098
页数:10
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[21]   THERMAL-STABILITY OF THIN PTSI FILMS ON SILICON SUBSTRATES [J].
SINHA, AK ;
SHENG, TT ;
MARCUS, RB ;
HASZKO, SE .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (09) :3637-+
[22]   DIFFERENTIAL RESISTANCE PEAKS OF SCHOTTKY BARRIER DIODES [J].
STRATTON, R ;
PADOVANI, FA .
SOLID-STATE ELECTRONICS, 1967, 10 (08) :813-&