INFLUENCE OF INELASTIC-SCATTERING ON THE PHOTOEMISSION LINE-SHAPE FOR SMALL PARTICLES

被引：2

作者：

DAVIS, SM

机构：

[1] Exxon Research Development Laboratories, Baton Rouge, Louisiana 70821

来源：

LANGMUIR | 1990年 / 6卷 / 02期

关键词：

D O I：

10.1021/la00092a039

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A simple approach for estimating dispersed-phase particle size from XPS results is proposed by considering the influence of inelastic scattering on the photoemission line shape. This analysis predicts a high sensitivity for detecting particle size differences for sizes in the range of about 0.5λ < d < 3λ, where X is the photoelectron attenuation length (e.g., sizes in the range of about 10-60 A). Opportunities exist for applying this type of analysis in studies of model heterogeneous catalysts. © 1990, American Chemical Society. All rights reserved.

引用

页码：517 / 519

页数：3

共 16 条

[1]

ANGEVINE PJ, 1976, 6TH P INT C CAT, P611

[2] PARTICLE-SIZE INFORMATION FROM DISPERSED PHASE PHOTOEMISSION INTENSITY RATIOS [J].