INVESTIGATION OF NEUTRON-IRRADIATION DAMAGE IN SILICON BY TRANSMISSION ELECTRON MICROSCOPY

被引:38
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PANKRATZ, JM
SPRAGUE, JA
RUDEE, ML
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10.1063/1.1655713
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O59 [应用物理学];
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页码:101 / &
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[11]   TRANSMISSION ELECTRON MICROSCOPY OF FAST-NEUTRON-IRRADIATED SILICON [J].
HEMMENT, PLF ;
GUNNERSE.EM .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (07) :2912-&
[12]  
HESKETH RV, 1966, R5269 AERE REPT, V2, P419
[13]  
HIRSCH PB, 1965, ELECTRON MICROSCOPY, P250
[14]   SOME ELECTRON DIFFRACTION CONTRAST EFFECTS AT PLANAR DEFECTS IN CRYSTALS [J].
HUMPHREYS, CJ ;
HOWIE, A ;
BOOKER, GR .
PHILOSOPHICAL MAGAZINE, 1967, 15 (135) :507-+
[15]  
INUISHI Y, 1963, J PHYS SOC JAPAN S3, V18, P240
[16]   ANOMALOUS IMAGES IN ELECTRON MICROSCOPY [J].
MCINTYRE, KG ;
BROWN, LM .
JOURNAL DE PHYSIQUE, 1966, 27 (7-8S) :178-+
[17]   INTERSTITIAL DISLOCATION LOOPS IN NEUTRON IRRADIATED COPPER [J].
MCINTYRE, KG .
PHILOSOPHICAL MAGAZINE, 1967, 15 (133) :205-&
[18]  
MCINTYRE KG, 1966, R5269 AERE REP, V2, P351
[19]  
MILLER DP, 1963, APPL PHYS LETTERS, V22, P33
[20]   NUCLEI OF STRAIN IN THE SEMI-INFINITE SOLID [J].
MINDLIN, RD ;
CHENG, DH .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (09) :926-930