PREBREAKDOWN CURRENTS DUE TO FILAMENTARY THERMAL BREAKDOWN IN POLYIMIDE FILMS

被引：21

作者：

MIZUTANI, T ^{[1
]}

KANNO, I ^{[1
]}

HIKITA, M ^{[1
]}

IEDA, M ^{[1
]}

SAWA, G ^{[1
]}

机构：

[1] MIE UNIV,DEPT ELECTR,TSU,MIE 514,JAPAN

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1987年 / 22卷 / 04期

关键词：

D O I：

10.1109/TEI.1987.298910

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：473 / 477

页数：5

共 11 条

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[2] NEW APPROACH TO BREAKDOWN STUDY BY MEASURING PRE-BREAKDOWN CURRENT IN INSULATING MATERIALS [J].

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IEDA, M .

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[3] SOLID BREAKDOWN PROCESS FROM VIEWPOINT OF NATURE OF PREBREAKDOWN CURRENT IN POLYMERIC INSULATING MATERIALS [J].

HIKITA, M ;

KANNO, I ;

SAWA, G ;

IEDA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (12) :1619-1622

[4] HIGH-FIELD CONDUCTION AND ELECTRICAL BREAKDOWN OF POLYETHYLENE AT HIGH-TEMPERATURES [J].

HIKITA, M ;

TAJIMA, S ;

KANNO, I ;

ISHINO, I ;

SAWA, G ;

IEDA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (08) :988-996

[5] CONSIDERATION ON FILAMENTARY THERMAL BREAKDOWN BY MEASURING PRE-BREAKDOWN CURRENT IN SOLID DIELECTRICS [J].

HIKITA, M ;

KANNO, I ;

SAWA, G ;

IEDA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (08) :984-987

[6] DIELECTRIC-BREAKDOWN PROCESS OF POLYMERS [J].

IEDA, M .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1980, 15 (03) :206-224

[7]

IIDA K, 1983, T IEE JPN, V103, P111

[8]

NAGAO M, 1977, T I ELEC JAPAN A, V97, P279

[9]

ODWYER JJ, 1973, THEORY ELECTRICAL CO

[10]

ODWYER JJ, 1964, THEORY DIELECTRIC BR, P137

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