共 3 条
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INTERCOMPARISON OF ABSOLUTE STANDARDS FOR RBS STUDIES
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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1983, 218 (1-3)
:147-148
[3]
CHARACTERIZATION OF A NEW BATCH OF ION-IMPLANTED BI IN SILICON SPECIMENS FOR USE AS PRIMARY REFERENCE SURFACE STANDARDS
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1983, 218 (1-3)
:91-96