AMORPHOUS HYDROGENATED CARBON-FILMS ON SEMICONDUCTORS .1. ELECTRONIC-PROPERTIES OF THE INTERFACE

被引：30

作者：

UGOLINI, D ^{[1
]}

EITLE, J ^{[1
]}

OELHAFEN, P ^{[1
]}

WITTMER, M ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 48卷 / 06期

关键词：

D O I：

10.1007/BF00617856

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：549 / 558

页数：10

共 27 条

[1]

ANGUS JC, 1987, AMORPHOUS HYDROGENAT, P167

[2] RELAXATION DURING PHOTOEMISSION AND LMM AUGER DECAY IN ARSENIC AND SOME OF ITS COMPOUNDS [J].

BAHL, MK ;

WOODALL, RO ;

WATSON, RL ;

IRGOLIC, KJ .

JOURNAL OF CHEMICAL PHYSICS, 1976, 64 (03) :1210-1218

[3] SURFACE, INTERFACE, AND BULK PROPERTIES OF AMORPHOUS-CARBON FILMS CHARACTERIZED BY INSITU ELLIPSOMETRY [J].

COLLINS, RW .

APPLIED PHYSICS LETTERS, 1988, 52 (24) :2025-2027

[4]

CRESCENZI MG, 1981, SOLID STATE COMMUN, V51, P811

[5] BONDING IN HYDROGENATED HARD CARBON STUDIED BY OPTICAL SPECTROSCOPY [J].

DISCHLER, B ;

BUBENZER, A ;

KOIDL, P .

SOLID STATE COMMUNICATIONS, 1983, 48 (02) :105-108

[6]

Kowalczyk S.P., 1976, THESIS U CALIFORNIA

[7]

LETTINGTON AH, 1987, AMORPHOUS HYDROGENAT, P359

[8] TOTAL VALENCE-BAND DENSITIES OF STATES OF III-V AND II-VI COMPOUNDS FROM X-RAY PHOTOEMISSION SPECTROSCOPY [J].

LEY, L ;

POLLAK, RA ;

MCFEELY, FR ;

KOWALCZY.SP ;

SHIRLEY, DA .

PHYSICAL REVIEW B, 1974, 9 (02) :600-621

[9] ELECTRONIC-STRUCTURE OF SUPPORTED SMALL METAL-CLUSTERS [J].

MASON, MG .

PHYSICAL REVIEW B, 1983, 27 (02) :748-762

[10]

OELHAFEN P, 1987, AMORPHOUS HYDROGENAT, P267

← 1 2 3 →