THE INVESTIGATION OF INSTRUMENTAL AND SAMPLE PARAMETERS AS POTENTIALS SOURCES FOR AFFECTING THE REPRODUCIBILITY OF ISOTOPIC RATIO MEASUREMENTS IN SECONDARY-ION MASS-SPECTROMETRY

被引:3
作者
ADRIAENS, A [1 ]
ADAMS, F [1 ]
机构
[1] UNIV INSTELLING ANTWERP,DEPT CHEM,UNIV PLEIN 1,B-2610 WILRIJK,BELGIUM
关键词
D O I
10.1002/sia.740220165
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this study a number of instrumental and sample parameters were investigated as potential sources for affecting the reproducibility of isotopic ratio measurements in secondary ion mass spectrometry. The study consisted of examining the energy distributions of the individual isotopes using different parameter settings. This way, 70% of the observed isotopic variation could be ascribed to the setting of certain instrumental parameters such as the field aperture, the contrast diaphragm and the energy window width. In addition, the effects of differing crystal orientations in the sample and macroscopic surface characteristics upon the reproducibility were evaluated using imaging techniques.
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收藏
页码:300 / 303
页数:4
相关论文
共 8 条
[1]   COMPARISON BETWEEN THE PRECISION CHARACTERISTICS OF THE MAGNETIC AND ELECTROSTATIC PEAK SWITCHING SYSTEMS IN SECONDARY ION MASS-SPECTROMETRY [J].
ADRIAENS, A ;
ADAMS, F .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1991, 108 (01) :41-52
[2]  
BENINGHOVEN A, 1987, CHEM ANAL, V86
[3]  
DAVIES OL, 1972, STATISTICAL METHODS
[4]   VARIATIONS OF ISOTOPIC DISCRIMINATION IN SECONDARY ION MASS-SPECTROMETRY [J].
JULL, AJT .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 41 (03) :135-141
[5]  
LEPAREUR M, 1980, REV TECH THOMSON, V12, P225
[6]  
LODDING A, 1980, ADV MASS SPECTROM, V8, P471
[7]   ISOTOPE FRACTIONATION IN SECONDARY ION MASS-SPECTROMETRY [J].
SHIMIZU, N ;
HART, SR .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1303-1311
[8]  
SODERVALL U, 1986, SIMS, V5, P41