VARIATIONS OF ISOTOPIC DISCRIMINATION IN SECONDARY ION MASS-SPECTROMETRY

被引：14

作者：

JULL, AJT ^{[1
]}

机构：

[1] MAX PLANCK INST CHEM,D-6500 MAINZ,FED REP GER

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1982年 / 41卷 / 03期

关键词：

D O I：

10.1016/0020-7381(82)85030-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：135 / 141

页数：7

共 24 条

[1] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J].

ANDERSEN, CA ;

HINTHORNE, JR .

ANALYTICAL CHEMISTRY, 1973, 45 (08) :1421-1438

[2]

BRADLEY JG, 1978, J GEOPHYS RES, V83, P224

[3] MECHANISM OF SIMS MATRIX EFFECT [J].

DELINE, VR ;

KATZ, W ;

EVANS, CA .

APPLIED PHYSICS LETTERS, 1978, 33 (09) :832-835

[4] UNIFIED EXPLANATION FOR SECONDARY ION YIELDS [J].

DELINE, VR ;

EVANS, CA ;

WILLIAMS, P .

APPLIED PHYSICS LETTERS, 1978, 33 (07) :578-580

[5] QUANTITATIVE MODEL FOR INTERPRETATION OF SECONDARY ION MASS-SPECTRA OF DILUTE ALLOYS [J].

GRIES, WH ;

RUDENAUER, FG .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 18 (02) :111-127

[6] HIGH-RESOLUTION ION-MICROPROBE MEASUREMENT OF LEAD ISOTOPES - VARIATIONS WITHIN SINGLE ZIRCONS FROM LAC SEUL, NORTHWESTERN ONTARIO [J].

HINTON, RW ;

LONG, JVP .

EARTH AND PLANETARY SCIENCE LETTERS, 1979, 45 (02) :309-325

[7]

HUTCHEON ID, 1978, P LUNAR PLANET SCI C, P1345

[8] THE APPLICATION OF THE SIMS TECHNIQUE TO QUANTITATIVE CHEMICAL-ANALYSIS [J].

JURELA, Z .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1981, 37 (01) :67-75

[9] MEASUREMENT OF LITHIUM ISOTOPIC COMPOSITION IN REFRACTORY INCLUSIONS OF ALLENDE [J].

KLOSSA, B ;

PIERRE, A ;

MINSTER, JF .

EARTH AND PLANETARY SCIENCE LETTERS, 1981, 52 (01) :25-30

[10]

LEPAREUR M, 1980, REV TECH THOMSON, V12, P225

← 1 2 3 →