LATEST TRENDS IN PARTS SEP SUSCEPTIBILITY FROM HEAVY-IONS

被引：8

作者：

NICHOLS, DK ^{[1
]}

SMITH, LST ^{[1
]}

SOLI, GA ^{[1
]}

KOGA, R ^{[1
]}

KOLASINSKI, WA ^{[1
]}

机构：

[1] AEROSPACE CORP,EL SEGUNDO,CA 90245

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/23.45453

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2388 / 2397

页数：10

共 6 条

[1] A SUMMARY OF SEU TEST-RESULTS USING CF-252 [J].

HARBOESORENSEN, R ;

ADAMS, L ;

SANDERSON, TK .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1622-1628

[2] SEU TEST TECHNIQUES FOR 256K STATIC RAMS AND COMPARISONS OF UPSETS INDUCED BY HEAVY-IONS AND PROTONS [J].

KOGA, R ;

KOLASINSKI, WA ;

OSBORN, JV ;

ELDER, JH ;

CHITTY, R .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1638-1643

[3] TRENDS IN PARTS SUSCEPTIBILITY TO SINGLE EVENT UPSET FROM HEAVY-IONS [J].

NICHOLS, DK ;

PRICE, WE ;

KOLASINSKI, WA ;

KOGA, R ;

PICKEL, JC ;

BLANDFORD, JT ;

WASKIEWICZ, AE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4189-4194

[4] RECENT TRENDS IN PARTS SEU SUSCEPTIBILITY FROM HEAVY-IONS [J].

NICHOLS, DK ;

SMITH, LS ;

PRICE, WE ;

KOGA, R ;

KOLASINSKI, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) :1332-1337

[5] FULL TEMPERATURE SINGLE EVENT UPSET CHARACTERIZATION OF 2 MICROPROCESSOR TECHNOLOGIES [J].

NICHOLS, DK ;

COSS, JR ;

SMITH, LS ;

RAX, B ;

HUEBNER, M ;

WATSON, K .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1619-1621

[6]

NICHOLS DK, 1988, IEEE NUCL S

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