FULL TEMPERATURE SINGLE EVENT UPSET CHARACTERIZATION OF 2 MICROPROCESSOR TECHNOLOGIES

被引：7

作者：

NICHOLS, DK

COSS, JR

SMITH, LS

RAX, B

HUEBNER, M

WATSON, K

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

D O I：

10.1109/23.25508

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1619 / 1621

页数：3

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