A NEW APPROACH IN TEXTURE RESEARCH - LOCAL ORIENTATION DETERMINATION WITH EBSP

A new technique for convenient measurement of crystallographic orientation of small volumes in bulk samples is introduced. It makes use of electron back scattering patterns (EBSP) in the SEM. The principle of pattern formation as well as measuring and evaluation procedure are introduced. The method offers a viable procedure for obtaining information on the spatial arrangement of orientations, i.e. on orientation topography and thus, provides a new level of information on crystallographic texture. The application of EBSP is demonstrated by two examples, namely for investigation of nucleation of recrystallization and microstructure evolution during high-temperature fatigue.