MONTE-CARLO SIMULATION OF THIN-FILM X-RAY-MICROANALYSIS AT HIGH-ENERGIES

被引：18

作者：

ROSA, R

ARMIGLIATO, A

机构：

来源：

X-RAY SPECTROMETRY | 1989年 / 18卷 / 01期

关键词：

D O I：

10.1002/xrs.1300180106

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：19 / 23

页数：5

共 18 条

[1] DETERMINATION OF COMPOSITION AND THICKNESS OF TINX OY FILMS ON SILICON BY COMBINED X-RAY AND NUCLEAR MICROANALYSIS [J].

ARMIGLIATO, A ;

GARULLI, A ;

ROSA, R ;

BERTI, M ;

DRIGO, AV ;

DESALVO, A .

X-RAY SPECTROMETRY, 1983, 12 (01) :38-41

[2] APPLICATION OF MONTE-CARLO TECHNIQUE TO THE ELECTRON-PROBE MICROANALYSIS OF TERNARY SI-B-O FILMS ON SILICON [J].

ARMIGLIATO, A ;

DESALVO, A ;

RINALDI, R ;

ROSA, R .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (08) :1299-1308

[3]

ARNAL F, 1977, ULTRAMICROSCOPY, V2, P305

[4] QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].

CLIFF, G ;

LORIMER, GW .

JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207

[5] MONTE-CARLO SIMULATION OF ELASTIC AND INELASTIC-SCATTERING OF ELECTRONS IN THIN-FILMS .2. CORE ELECTRON LOSSES [J].

DESALVO, A ;

ROSA, R .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (06) :790-795

[6]

DUNCUMB P, 1969, 5TH P INT C XRAY OPT, P146

[7] COMPUTERS AND THE THEORY OF STATISTICS - THINKING THE UNTHINKABLE [J].

EFRON, B .

SIAM REVIEW, 1979, 21 (04) :460-480

[8] 1977 RIETZ LECTURE - BOOTSTRAP METHODS - ANOTHER LOOK AT THE JACKKNIFE [J].

EFRON, B .

ANNALS OF STATISTICS, 1979, 7 (01) :1-26

[9]

GOLDSTEIN JI, 1979, INTRO ANAL ELECTRON, pCH3

[10] NEW MODEL OF ELECTRON FREE-PATH IN MULTIPLE LAYERS FOR MONTE-CARLO SIMULATION [J].

HORIGUCHI, S ;

SUZUKI, M ;

KOBAYASHI, T ;

YOSHINO, H ;

SAKAKIBARA, Y .

APPLIED PHYSICS LETTERS, 1981, 39 (06) :512-514

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