INVESTIGATION OF GAAS-MESFET EQUIVALENT-CIRCUITS USING TRANSIENT CURRENT-CONTINUITY EQUATION SOLUTIONS

被引:6
作者
ANHOLT, R
机构
[1] Gateway Modeling, Inc., Minneapolis, MN 55414
关键词
D O I
10.1016/0038-1101(91)90004-I
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Transient solutions of Poisson and electron current-continuity equations are made to investigate the dependence of the equivalent-circuit parameters C(ds), tau, and R(i) on the gate and drain biases. We find that C(ds) is related by a single time constant to R(ds). A new model for the Y21 matrix element is proposed that does not involve the parameter tau. At high frequencies, the frequency-dependent parts of the Y matrices are better modeled using four independent time constants. Comparisons of the simulations with equivalent-circuit parameters extracted for 0.22-mu-m and 1.15-mu-m gate-length MESFETs are made.
引用
收藏
页码:693 / 700
页数:8
相关论文
共 15 条
[11]  
PINTO M, 1984, PISCES 2 2 B
[12]  
Pucel RA, 1975, ADV ELECTRONICS ELEC, V38, P195, DOI DOI 10.1016/S0065-2539(08)61205-6
[13]  
Sango M., 1988, 1988 IEEE MTT International Microwave Symposium Digest (Cat. No.88CH2489-3), P1053, DOI 10.1109/MWSYM.1988.22212
[14]   GAAS-FET DEVICE AND CIRCUIT SIMULATION IN SPICE [J].
STATZ, H ;
NEWMAN, P ;
SMITH, IW ;
PUCEL, RA ;
HAUS, HA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (02) :160-169
[15]   HIGH-FREQUENCY LIMITS OF MILLIMETER-WAVE TRANSISTORS [J].
STEER, MB ;
TREW, RJ .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (11) :640-642