THE ELECTRICAL AND OPTICAL-PROPERTIES OF THE ZNO-SNO2 THIN-FILMS PREPARED BY RF MAGNETRON SPUTTERING

被引:121
作者
ENOKI, H
NAKAYAMA, T
ECHIGOYA, J
机构
[1] Department of Materials Processing, Faculty of Engineering, Tohoku University, Sendai
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1992年 / 129卷 / 01期
关键词
D O I
10.1002/pssa.2211290116
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
ZnO-SnO2 thin films are deposited by rf sputtering using a sintered oxide target. As-deposited films show different crystal structures of a hexagonal ZnO, a spinel type intermediate compound Zn2SnO4 or an amorphous by experimental conditions. The Zn2SnO4 films show higher than 80% transmissivity over the visible range and their lower side absorption edge is less than 320 nm. The electrical resistivity of as sputtered Zn2SnO4 films is about 5.0 x 10(-2) OMEGA cm and is decreased up to about 1.7 x 10(-2) OMEGA cm by a vacuum annealing due to the rapid increase of both, oxygen vacancies and carrier concentration. The resistivity and transmissivity of the amorphous ZnO-SnO2 films are almost the same values as that of Zn2SnO4 films.
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页码:181 / 191
页数:11
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