STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE

被引：4

作者：

HETHERINGTON, MG ^{[1
]}

CEREZO, A ^{[1
]}

HYDE, JM ^{[1
]}

SMITH, GDW ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MAT,PARKS RD,OXFORD OX1 3PH,ENGLAND

来源：

SURFACE SCIENCE | 1992年 / 266卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(92)91062-G

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The position sensitive atom probe (POSAP) is an extremely high resolution technique for microanalysis. In addition to its microanalytical capabilities, it can also be used to determine the three-dimensional structure of fine scale percolated microstructures. Presentation of data is a major issue in studying three-dimensional microstructures and new techniques of visualization using a graphics supercomputer are presented in this paper. The interpretation of the results requires the modelling of the underlying physical processes. Two modelling techniques are presented; a numerical solution to the nonlinear diffusion equation and a Monte Carlo simulation. The visualization and parameterization of the microstructures determined from POSAP data are compared with those produced from numerical solutions and the Monte Carlo simulations.

引用

页码：463 / 470

页数：8

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