MONITORING OF THIN-FILMS FOR OPTICAL PURPOSES

被引：15

作者：

MACLEOD, HA ^{[1
]}

机构：

[1] NEWCASTLE POLYTECH, DEPT PHYS & PHYS ELECTR, NEWCASTLE UPON TYNE NE1 8ST, TYNE & WEAR, ENGLAND

来源：

VACUUM | 1977年 / 27卷 / 04期

关键词：

D O I：

10.1016/0042-207X(77)90028-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：383 / 390

页数：8

共 30 条

[1]

Behrndt K. H., 1966, PHYS THIN FILMS, V3, P1

[2] STICKING COEFFICIENTS OF SILVER ON METAL AND OXIDE SUBSTRATES FROM 20 TO 575 DEGREES C [J].

BENCK, RF ;

CRISCO, C ;

SPIES, HL .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (04) :562-563

[3] EFFECT OF WATER VAPOR ON STICKING COEFFICIENT OF LEAD ON SILICON MONOXIDE [J].

BLOORE, EW ;

OLSON, FA .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01) :144-147

[4] OPTICAL FILTERS - MONITORING PROCESS ALLOWING AUTO-CORRECTION OF THICKNESS ERRORS [J].

BOUSQUET, P ;

FORNIER, A ;

KOWALCZYK, R ;

PELLETIER, E ;

ROCHE, P .

THIN SOLID FILMS, 1972, 13 (02) :285-290

[5] TEMPERATURE-DEPENDENCE OF CONDENSATION OF SILVER ON GLASS [J].

DOBREV, D ;

BOICHEVA, L .

THIN SOLID FILMS, 1976, 32 (02) :237-240

[6] OPTICAL THICKNESS CHANGES IN FRESHLY DEPOSITED LAYERS OF LEAD-TELLURIDE [J].

EVANS, CS ;

HUNNEMAN, R ;

SEELEY, JS .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (02) :321-328

[7] INCREMENTS AT INTERFACE BETWEEN LAYERS DURING INFRARED FILTER MANUFACTURE [J].

EVANS, CS ;

HUNNEMAN, R ;

SEELEY, JS .

OPTICA ACTA, 1976, 23 (04) :297-303

[8]

FORNIER A, COMMUNICATION

[9]

Gregg S. J., 1967, ADSORPTION SURFACE A

[10] ZUM KONDENSATIONSVERHALTEN HOCHSIEDENDER SUBSTANZEN [J].

GUNTHER, KG .

ZEITSCHRIFT FUR PHYSIK, 1957, 149 (05) :538-549

← 1 2 3 →