FAILURE-RATE AS A FUNCTION OF TIME DUE TO LOG-NORMAL LIFE DISTRIBUTION(S) OF WEAK PARTS

被引：6

作者：

HALLBERG, O ^{[1
]}

机构：

[1] ELLEMTEL UTVECKLINGS AKTIEBOLAG,ALVSJO,SWEDEN

来源：

MICROELECTRONICS AND RELIABILITY | 1977年 / 16卷 / 02期

关键词：

D O I：

10.1016/0026-2714(77)90416-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：155 / 158

页数：4

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KALMAR, G .

MICROELECTRONICS AND RELIABILITY, 1975, 14 (5-6) :469-&

[2] THERMALLY ACCELERATED AGING OF SEMICONDUCTOR COMPONENTS [J].

REYNOLDS, FH .

PROCEEDINGS OF THE IEEE, 1974, 62 (02) :212-222

[3]

STRANDBERG K, TILLFORLITLIGHETSTEK