Electron scanner of the structure of surfaces and thin layers

被引:25
作者
Knoll, M.
Theile, R.
机构
来源
ZEITSCHRIFT FUR PHYSIK | 1939年 / 113卷 / 3-4期
关键词
D O I
10.1007/BF01341357
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:260 / 280
页数:21
相关论文
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[21]  
KNOLL M, 1932, Z PHYS, V78, P335
[22]  
KNOLL M, 1936, Z TECH PHYS, V17, P604
[23]  
KOLLATH B, 1937, PHYS Z, V38, P202
[24]  
KRAUSE F, 1938, RADIOLOGICA, V3, P122
[25]  
Mahl H, 1938, ANN PHYS-BERLIN, V31, P425
[26]  
Mahl H., 1937, NATURWISSENSCHAFTEN, V25, P459
[27]  
Mahl H., 1935, Z TECH PHYS, V16, P219
[28]  
MARTON L, 1936, B ACAD ROY BELG S, V22, P1336
[29]   An electron microscope for studying thermal and secondary electron emission [J].
Meschter, E .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1938, 9 (01) :12-15
[30]   The electrical reproduction of images by the photoconductive effect [J].
Miller, H ;
Strange, JW .
PROCEEDINGS OF THE PHYSICAL SOCIETY, 1938, 50 :374-384