CORRELATION BETWEEN THE LUMINESCENCE AND RAMAN PEAKS IN QUANTUM-CONFINED SYSTEMS

被引:7
作者
DEAK, P
HAJNAL, Z
STUTZMANN, M
FUCHS, HD
机构
[1] TECH UNIV MUNICH,WALTER SCHOTTKY INST,W-8000 MUNICH,GERMANY
[2] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART,GERMANY
关键词
BAND STRUCTURE; NANOSTRUCTURES; RAMAN SCATTERING; SILICON;
D O I
10.1016/0040-6090(94)05663-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two of the main models for the explanation of strong visible-light emission in silicon, namely physical quantum confinement of electrons in nanometer-size ''wires'' or spherical crystallites, and chemical quantum confinement to subnanometer-size silicon particles due to the isolating effect of oxygen atoms, are considered with regard to a possible correlation between Raman shift and photoluminescence (PL) peak position. The physical confinement model predicts opposite shifts with changing size of the confinement. In the chemical confinement model, the shift of the gap is not a size effect; it occurs owing to chemical substitution of the bond terminators of the silicon atoms. This is accompanied by a parallel shift in the Raman frequency. The calculation of the vibration spectra of small size wires and spheres allows the correct assignment of experimentally observed Raman peaks. With the help of this assignment, the analysis of the observed spectra shows a parallel shift of Raman and PL peaks. The calculated frequencies for siloxene derivatives (a known manifestation of chemical quantum confinement) are lower than those observed in most porous silicon samples; still the parallel shift favors the idea of chemical as against physical quantum confinement.
引用
收藏
页码:241 / 245
页数:5
相关论文
共 25 条
[1]   THE ORIGIN OF VISIBLE LUMINESCENCE FROM POROUS SILICON - A NEW INTERPRETATION [J].
BRANDT, MS ;
FUCHS, HD ;
STUTZMANN, M ;
WEBER, J ;
CARDONA, M .
SOLID STATE COMMUNICATIONS, 1992, 81 (04) :307-312
[2]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[3]   EVALUATION OF SEMIEMPIRICAL QUANTUM-CHEMICAL METHODS IN SOLID-STATE APPLICATIONS .2. CYCLIC-CLUSTER CALCULATIONS OF SILICON [J].
DEAK, P ;
SNYDER, LC .
PHYSICAL REVIEW B, 1987, 36 (18) :9619-9627
[4]   SILOXENE - CHEMICAL QUANTUM CONFINEMENT DUE TO OXYGEN IN A SILICON MATRIX [J].
DEAK, P ;
ROSENBAUER, M ;
STUTZMANN, M ;
WEBER, J ;
BRANDT, MS .
PHYSICAL REVIEW LETTERS, 1992, 69 (17) :2531-2534
[5]   THEORETICAL-STUDIES ON THE CORE STRUCTURE OF THE 450-DEGREES-C OXYGEN THERMAL DONORS IN SILICON [J].
DEAK, P ;
SNYDER, LC ;
CORBETT, JW .
PHYSICAL REVIEW B, 1992, 45 (20) :11612-11626
[6]   HYDROGEN COMPLEXES AND THEIR VIBRATIONS IN UNDOPED CRYSTALLINE SILICON [J].
DEAK, P ;
SNYDER, LC ;
HEINRICH, M ;
ORTIZ, CR ;
CORBETT, JW .
PHYSICA B, 1991, 170 (1-4) :253-258
[7]  
Deak P., 1993, Modern Physics Letters B, V7, P1343, DOI 10.1142/S0217984993001399
[8]   GROUND-STATES OF MOLECULES .38. MNDO METHOD - APPROXIMATIONS AND PARAMETERS [J].
DEWAR, MJS ;
THIEL, W .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1977, 99 (15) :4899-4907
[9]   RAMAN-SPECTROSCOPY OF LOW-DIMENSIONAL SEMICONDUCTORS [J].
FAUCHET, PM ;
CAMPBELL, IH .
CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1988, 14 :S79-S101
[10]   POROUS SILICON AND SILOXENE - VIBRATIONAL AND STRUCTURAL-PROPERTIES [J].
FUCHS, HD ;
STUTZMANN, M ;
BRANDT, MS ;
ROSENBAUER, M ;
WEBER, J ;
BREITSCHWERDT, A ;
DEAK, P ;
CARDONA, M .
PHYSICAL REVIEW B, 1993, 48 (11) :8172-8183