HIGH TEMPERATURE CAMERA FOR X-RAY TOPOGRAPHY

被引：11

作者：

BLECH, IA

GUYAUX, J

COOPER, G

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1967年 / 38卷 / 05期

关键词：

D O I：

10.1063/1.1720788

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：638 / &

共 10 条

[1] HIGH-TEMPERATURE X-RAY TOPOGRAPHY OF SI WAFERS STRAINED BY THIN SURFACE FILMS [J].

BLECH, IA ;

MEIERAN, ES .

APPLIED PHYSICS LETTERS, 1966, 9 (06) :245-&

[2] STRAIN IN THIN METAL FILMS ON QUARTZ [J].

HARUTA, K ;

SPENCER, WJ .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (06) :2232-&

[3]

JENKINSON AE, 1962, DIRECT OBSERVATION I, P29

[4] A STUDY OF LATTICE DISTORTION BY AN X-RAY DIFFRACTION TECHNIQUE [J].

KATO, N .

ACTA METALLURGICA, 1958, 6 (10) :647-652

[5] DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J].

LANG, AR .

JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) :597-598

[6] APPLICATIONS OF LIMITED PROJECTION TOPOGRAPHS AND DIRECT BEAM TOPOGRAPHS IN DIFFRACTION TOPOGRAPHY [J].

LANG, AR .

BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (12) :904-&

[7] A METHOD FOR THE EXAMINATION OF CRYSTAL SECTIONS USING PENETRATING CHARACTERISTIC X-RADIATION [J].

LANG, AR .

ACTA METALLURGICA, 1957, 5 (07) :358-364

[8] X-RAY EXTINCTION CONTRAST TOPOGRAPHY OF SILICON STRAINED BY THIN SURFACE FILMS [J].

MEIERAN, ES ;

BLECH, IA .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (10) :3162-&

[9] DIRECT X-RAY OBSERVATION OF DISLOCATIONS DURING ANNEALING IN ALUMINIUM SINGLE CRYSTALS [J].

NOST, B ;

SORENSEN, G .

PHILOSOPHICAL MAGAZINE, 1966, 13 (125) :1075-&

[10]

WEBB WW, 1962, DIRECT OBSERVATION I, P471

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