COMPARISON OF FREQUENCY LIMITED BUBBLE DEVICE PERFORMANCE AND MATERIAL CHARACTERISTICS

被引：5

作者：

DOYLE, WD ^{[1
]}

JOSEPHS, RM ^{[1
]}

SMITH, AB ^{[1
]}

机构：

[1] SPERRY RAND CORP,RES CTR,SUDBURY,MA 01776

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1978年 / 14卷 / 05期

关键词：

D O I：

10.1109/TMAG.1978.1059985

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：303 / 305

页数：3

共 12 条

[1] MAGNETIC BUBBLES - EMERGING NEW MEMORY TECHNOLOGY [J].

BOBECK, AH ;

BONYHARD, PI ;

GEUSIC, JE .

PROCEEDINGS OF THE IEEE, 1975, 63 (08) :1176-1195

[2] CHARACTERIZATION AND TEST-RESULTS FOR A 272K BUBBLE MEMORY PACKAGE [J].

BOBECK, AH ;

DANYLCHUK, I .

IEEE TRANSACTIONS ON MAGNETICS, 1977, 13 (05) :1370-1372

[3]

FONTANA RE, 1976, AIP C P, V34, P170

[4] DYNAMIC CONVERSION OF MAGNETIC-BUBBLE DOMAIN-WALLS AT MEGAHERTZ FREQUENCIES IN EPITAXIAL GARNET-FILMS [J].

HAGEDORN, FB ;

BLANK, SL ;

PEIRCE, RJ .

APPLIED PHYSICS LETTERS, 1975, 26 (04) :206-209

[5] MAGNETIC-BUBBLE DEVICE TESTING [J].

HAGEDORN, FB ;

RAGO, LF ;

KISH, DE ;

CHEN, YS ;

HESS, WE ;

BEURRIER, HR ;

WAGNER, WDP .

IEEE TRANSACTIONS ON MAGNETICS, 1977, 13 (05) :1364-1369

[6] LONG-TERM TESTING OF 68 KBIT BUBBLE DEVICE CHIPS [J].

HAGEDORN, FB .

IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :680-682

[7] MAGNETIC-BUBBLE DUAL-IN-LINE PACKAGE (DIP) FUNCTIONAL AND RELIABILITY TESTING [J].

KOWALCHUK, R ;

BOBECK, AH ;

BUTHERUS, AD ;

CIAK, FJ ;

SMITH, DH .

IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :691-693

[8]

LEEUW FHD, 1978 INT C FLOR

[9]

MALOZEMOFF AP, 1976, AIP C P, V29, P58

[10] ELECTRICAL CHARACTERIZATION OF A PACKAGED 100K BIT MAJOR-MINOR LOOP BUBBLE DEVICE [J].

NADEN, RA ;

KEENAN, WR ;

LEE, DM .

IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :685-687

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