A NIER-JOHNSON SECONDARY ION MASS-SPECTROMETER FOR ELECTRODE SURFACE STUDY AND ELECTROCHEMICAL PRODUCT CHARACTERIZATIONS

被引：4

作者：

DAOLIO, S

FACCHIN, B

PAGURA, C

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1987年 / 76卷 / 03期

关键词：

D O I：

10.1016/0168-1176(87)83032-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：277 / 286

页数：10

共 23 条

[1] BENNINGHOVEN A, 1984, SECONDARY ION MASS S, V4, P342
[2] CAMPANA JE, 1983, ION FORMATION ORGANI, P144
[3] HIGH-PERFORMANCE SECONDARY ION MASS-SPECTROMETER
COLTON, RJ
CAMPANA, JE
BARLAK, TM
DECORPO, JJ
WYATT, JR
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (12) : 1685 - 1689
[4] MOLECULAR SECONDARY ION MASS-SPECTROMETRY
DAY, RJ
UNGER, SE
COOKS, RG
[J]. ANALYTICAL CHEMISTRY, 1980, 52 (04) : A557 - &
[5] DEPTH PROFILING BY ION MICROPROBE WITH HIGH MASS RESOLUTION
DEGREVE, F
FIGARET, R
LATY, P
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 29 (04): : 351 - 361
[6] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION
EVANS, CA
[J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &
[7] THE DEVELOPMENT OF SECONDARY ION MASS-SPECTROMETRY (SIMS) - A RETROSPECTIVE
HONIG, RE
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 66 (01): : 31 - 54
[8] SECONDARY-ION MASS-SPECTROMETRY (SIMS) OF ORGANIC-COMPOUNDS .1. SAMPLE PREPARATION METHODS
KLOPPEL, KD
WEYER, K
VONBUNAU, G
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 51 (01): : 47 - 61
[9] HIGH-RESOLUTION SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR USE IN CHEMISTRY
KLOPPEL, KD
VONBUNAU, G
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 39 (01): : 85 - 93
[10] KRAUSS AR, 1981, MASS SPECTROMETRY, V6, P118