FAST COMPUTER-CONTROLLED MIRROR SYSTEM FOR INTENSITY MEASUREMENTS IN LOW-ENERGY ELECTRON-DIFFRACTION

被引:5
作者
BERNDT, W
机构
关键词
D O I
10.1063/1.1136931
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:221 / 224
页数:4
相关论文
共 8 条
  • [1] HANKE G, 1979, SURF SCI, V91, P193
  • [2] FAST LEED INTENSITY MEASUREMENTS FROM NI(100)-C(2X2)CO
    HEINZ, K
    LANG, E
    MULLER, K
    [J]. SURFACE SCIENCE, 1979, 87 (02) : 595 - 604
  • [3] SIMPLE METHOD OF AUTOMATIC LEED SPOT TRACING
    KANAJI, T
    NAKATSUKA, H
    URANO, T
    TAKI, Y
    [J]. SURFACE SCIENCE, 1979, 86 (JUL) : 587 - 590
  • [4] LEED STUDY OF MGO(100) .1. EXPERIMENT
    LEGG, KO
    PRUTTON, M
    KINNIBURGH, C
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1974, 7 (23): : 4236 - 4246
  • [5] STRUCTURE DETERMINATION OF THE RECONSTRUCTED AU(110) SURFACE
    MORITZ, W
    WOLF, D
    [J]. SURFACE SCIENCE, 1979, 88 (2-3) : L29 - L34
  • [6] RAPID, PULSE COUNTING LOW-ENERGY ELECTRON-DIFFRACTION INSTRUMENT
    STAIR, PC
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (01) : 132 - 135
  • [7] NEW RAPID AND ACCURATE METHOD TO MEASURE LOW-ENERGY-ELECTRON-DIFFRACTION BEAM INTENSITIES - INTENSITIES FROM CLEAN PT (111) CRYSTAL-FACE
    STAIR, PC
    KAMINSKA, TJ
    KESMODEL, LL
    SOMORJAI, GA
    [J]. PHYSICAL REVIEW B, 1975, 11 (02): : 623 - 629
  • [8] UEDA K, 1977, 7TH P INT VAC C 3RD, P2423