SCANNING AUGER MICROSCOPY OF CORRODED SIC

被引：5

作者：

BROWNING, R ^{[1
]}

SMIALEK, J ^{[1
]}

JACOBSON, N ^{[1
]}

机构：

[1] NASA,LEWIS RES CTR,CLEVELAND,OH 44135

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1986年 / 5卷 / 11期

关键词：

FILMS - Microscopic Examination - MICROSCOPES; ELECTRON; -; Applications; SPECTROSCOPY; AUGER ELECTRON - Spectrum Analysis;

D O I：

10.1007/BF01742219

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Recent molten salt corrosion studies have shown that Na//2SO//4 and Na//2CO//3 films on sintered alpha -SiC at 1000 degree C produced substantial amounts of Na//2O multiplied by (times) xSiO//2 and SiO//2. This corroded material contained several interesting features including pits, inclusions, and grain-boundary films. The purpose of this letter is to report an Auger examination of some of these features. Carbon-rich inclusions were found which were not completely oxidized and must therefore have existed in contact with the corrosion products. Features appearing to be grain-boundary films only slightly enriched in carbon were not the remains of carbon-rich sintering aids but were remnants of partially consumed SiC grains.

引用

页码：1122 / 1124

页数：3

共 11 条

[1] RATIOED SCATTER DIAGRAMS - AN EROTETIC METHOD FOR PHASE IDENTIFICATION ON COMPLEX-SURFACES USING SCANNING AUGER MICROSCOPY [J].