MICROANALYTICAL INVESTIGATION OF SINTERED SIC .2. STUDY OF THE GRAIN-BOUNDARIES OF SINTERED SIC BY HIGH-RESOLUTION AUGER-ELECTRON SPECTROSCOPY

[1] AN APPLICATION OF EELS IN THE EXAMINATION OF INCLUSIONS AND GRAIN-BOUNDARIES OF A SIC CERAMIC [J]. JOURNAL OF MICROSCOPY-OXFORD, 1981, 124 (OCT): : 49 - 56

[2] DAVIS LE, 1976, HDB AUGER ELECTRON S

[3] Grathwohl G, 1981, SCI CERAM, V11, P425

[4] MICROANALYTICAL INVESTIGATION OF SINTERED SIC .1. BULK MATERIAL AND INCLUSIONS [J]. JOURNAL OF MATERIALS SCIENCE, 1983, 18 (02) : 353 - 364

[5] KLAUA M, 1980, HDB FESTKORPERANALYS, P295

[6] SPUTTERING PROCESS OF A SILICON-CARBIDE SURFACE WITH ENERGETIC IONS BY MEANS OF AN AES-SIMS-FDS COMBINED SYSTEM [J]. JOURNAL OF NUCLEAR MATERIALS, 1978, 75 (01) : 7 - 13

[7] OGBUGI LU, 1981, MATER SCI RES, V14, P713

[8] Prochazka S, 1975, MASS TRANSPORT PHENO, P421, DOI [10.1007/978-1-4684-3150-6_28, DOI 10.1007/978-1-4684-3150-6_28]

[9] PROCHAZKA S, 1974, 74CRD186 GEN EL TECH

[10] RUHLE M, 1981, MATER SCI RES, V14, P167

[1] AN APPLICATION OF EELS IN THE EXAMINATION OF INCLUSIONS AND GRAIN-BOUNDARIES OF A SIC CERAMIC [J]. JOURNAL OF MICROSCOPY-OXFORD, 1981, 124 (OCT): : 49 - 56

[2] DAVIS LE, 1976, HDB AUGER ELECTRON S

[3] Grathwohl G, 1981, SCI CERAM, V11, P425

[4] MICROANALYTICAL INVESTIGATION OF SINTERED SIC .1. BULK MATERIAL AND INCLUSIONS [J]. JOURNAL OF MATERIALS SCIENCE, 1983, 18 (02) : 353 - 364

[5] KLAUA M, 1980, HDB FESTKORPERANALYS, P295

[6] SPUTTERING PROCESS OF A SILICON-CARBIDE SURFACE WITH ENERGETIC IONS BY MEANS OF AN AES-SIMS-FDS COMBINED SYSTEM [J]. JOURNAL OF NUCLEAR MATERIALS, 1978, 75 (01) : 7 - 13

[7] OGBUGI LU, 1981, MATER SCI RES, V14, P713

[8] Prochazka S, 1975, MASS TRANSPORT PHENO, P421, DOI [10.1007/978-1-4684-3150-6_28, DOI 10.1007/978-1-4684-3150-6_28]

[9] PROCHAZKA S, 1974, 74CRD186 GEN EL TECH

[10] RUHLE M, 1981, MATER SCI RES, V14, P167