SINGLE-CRYSTAL INTENSITY MEASUREMENTS WITH 3-CIRCLE COUNTER DIFFRACTOMETER

被引：148

作者：

ALEXANDER, LE

SMITH, GS

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1962年 / 15卷 / OCT期

关键词：

D O I：

10.1107/S0365110X62002613

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：983 / &

共 23 条

[11] COMPTON AH, 1935, XRAY THEORY EXPERIME
[12] DRENCK K, AM CRYSTALLOGRAPHIC
[13] LIMITS OF ACCURACY IN THE DETERMINATION OF LATTICE PARAMETERS AND STRESSES BY THE DEBYE-SCHERRER METHOD
EKSTEIN, H
SIEGEL, S
[J]. ACTA CRYSTALLOGRAPHICA, 1949, 2 (02): : 99 - 104
[14] USE OF A GEIGER COUNTER FOR THE MEASUREMENT OF X-RAY INTENSITIES FROM SMALL SINGLE CRYSTALS
EVANS, HT
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (02) : 156 - 161
[15] APPARATUS FOR MEASURING COMPLETE SINGLE-CRYSTAL X-RAY DIFFRACTION DATA BY MEANS OF A GEIGER COUNTER DIFFRACTOMETER
FURNAS, TC
HARKER, D
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (05) : 449 - 453
[16] FURNAS TC, 1957, SINGLE CRYSTAL ORIEN
[17] INTERPRETATION OF DIFFRACTOMETER LINE PROFILES
LADELL, J
PARRISH, W
TAYLOR, J
[J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (08): : 561 - 567
[18] LADELL J, 1960, ACT CRYST, V13
[19] LADELL J, ACT CRYST, V13, P986
[20] LADELL J, 1959, ACT CRYST, V12, P563