THE SIGNIFICANCE OF REDUCED THICKNESSES DETERMINED BY XPS USING THE VARIABLE TAKE-OFF ANGLE TECHNIQUE

[1] ANGULAR-DEPENDENCE OF X-RAY PHOTOELECTRONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 911 - 920

[2] Ebel M. F., 1980, Surface and Interface Analysis, V2, P173, DOI 10.1002/sia.740020504

[3] DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (04) : 287 - 322

[4] EBEL MF, 1980, ADV XRAY ANAL, V23, P233

[5] EBEL MF, 1979, SURF INTERFACE ANAL, V1, P58

[6] ANGULAR DISTRIBUTION OF PHOTOELECTRONS FROM A METAL SINGLE CRYSTAL [J]. PHYSICS LETTERS A, 1971, A 35 (05) : 375 - +

[7] FADLEY CS, 1972, ELECTRON SPECTROSCOP, P233

[8] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J]. SURFACE SCIENCE, 1973, 36 (02) : 661 - 674

[9] HIROKAWA K, 1977, Z ANAL CHEM, V285, P192

[10] HIROKAWA K, 1977, Z ANAL CHEM, V286, P41

[1] ANGULAR-DEPENDENCE OF X-RAY PHOTOELECTRONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 911 - 920

[2] Ebel M. F., 1980, Surface and Interface Analysis, V2, P173, DOI 10.1002/sia.740020504

[3] DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (04) : 287 - 322

[4] EBEL MF, 1980, ADV XRAY ANAL, V23, P233

[5] EBEL MF, 1979, SURF INTERFACE ANAL, V1, P58

[6] ANGULAR DISTRIBUTION OF PHOTOELECTRONS FROM A METAL SINGLE CRYSTAL [J]. PHYSICS LETTERS A, 1971, A 35 (05) : 375 - +

[7] FADLEY CS, 1972, ELECTRON SPECTROSCOP, P233

[8] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J]. SURFACE SCIENCE, 1973, 36 (02) : 661 - 674

[9] HIROKAWA K, 1977, Z ANAL CHEM, V285, P192

[10] HIROKAWA K, 1977, Z ANAL CHEM, V286, P41