POLARIZATION CONTRAST IN FLUORESCENCE SCANNING NEAR-FIELD OPTICAL REFLECTION MICROSCOPY

被引:14
作者
JALOCHA, A [1 ]
VANHULST, NF [1 ]
机构
[1] UNIV TWENTE,MESA RES INST,7500 AE ENSCHEDE,NETHERLANDS
关键词
D O I
10.1364/JOSAB.12.001577
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Polarization contrast is presented in fluorescence images of a Langmuir-Blodgett monolayer obtained with a scanning near-field optical microscope operated in reflection. A tapered optical fiber is used both to excite and to collect the fluorescence. The lateral resolution in the reflection fluorescence image is estimated at 200 nm. Shear-force detection controls the tip-to-surface distance and simultaneously gives a topographic map. Direct correlation between topography and the fluorescent domain is thus obtained. We show that the fluorescence is polarized along the molecular orientation in the Langmuir-Blodgett monolayer. Thus we demonstrate the study of the polarization direction in the reflection mode.
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收藏
页码:1577 / 1580
页数:4
相关论文
共 30 条
[1]   ALTERATIONS OF SINGLE-MOLECULE FLUORESCENCE LIFETIMES IN NEAR-FIELD OPTICAL MICROSCOPY [J].
AMBROSE, WP ;
GOODWIN, PM ;
MARTIN, JC ;
KELLER, RA .
SCIENCE, 1994, 265 (5170) :364-367
[2]   SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].
ASH, EA ;
NICHOLLS, G .
NATURE, 1972, 237 (5357) :510-&
[3]   MACROSCOPIC SELF-CONSISTENT MODEL FOR EXTERNAL-REFLECTION NEAR-FIELD MICROSCOPY [J].
BERNTSEN, S ;
BOZHEVOLNAYA, E ;
BOZHEVOLNYI, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1993, 10 (05) :878-885
[4]   NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM) - DEVELOPMENT AND BIOPHYSICAL APPLICATIONS [J].
BETZIG, E ;
LEWIS, A ;
HAROOTUNIAN, A ;
ISAACSON, M ;
KRATSCHMER, E .
BIOPHYSICAL JOURNAL, 1986, 49 (01) :269-279
[5]   COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
FINN, PL ;
WEINER, JS .
APPLIED PHYSICS LETTERS, 1992, 60 (20) :2484-2486
[6]   SINGLE MOLECULES OBSERVED BY NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
CHICHESTER, RJ .
SCIENCE, 1993, 262 (5138) :1422-1425
[7]   REFLECTION-SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY OF OPAQUE SAMPLES [J].
BIELEFELDT, H ;
HORSCH, I ;
KRAUSCH, G ;
LUXSTEINER, M ;
MLYNEK, J ;
MARTI, O .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02) :103-108
[8]   EXTERNAL AND INTERNAL-REFLECTION NEAR-FIELD MICROSCOPY - EXPERIMENTS AND RESULTS [J].
COURJON, D ;
VIGOUREUX, JM ;
SPAJER, M ;
SARAYEDDINE, K ;
LEBLANC, S .
APPLIED OPTICS, 1990, 29 (26) :3734-3740
[9]   THEORY OF NEAR-FIELD OPTICS WITH APPLICATIONS TO SNOM AND OPTICAL BINDING [J].
DEREUX, A ;
VIGNERON, JP ;
LAMBIN, P ;
LUCAS, AA .
PHYSICA B, 1991, 175 (1-3) :65-67
[10]  
FISCHER UC, 1987, SCAN MICROSC S, V1, P47