DEFECTS IN METALORGANIC CHEMICAL VAPOR-DEPOSITION EPITAXY-GROWN ZNSE FILMS ON GAAS INVESTIGATED BY MONOENERGETIC POSITRONS

被引:8
作者
WEI, L
CHO, YK
DOSHO, C
TANIGAWA, S
YODO, T
YAMASHITA, K
机构
[1] NIPPON SHEET GLASS CO LTD,TSUKUBA RES LAB,TSUKUBA,IBARAKI 30026,JAPAN
[2] KOREA STAND RES INST,TAEJON 305606,SOUTH KOREA
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1991年 / 30卷 / 10期
关键词
ZNSE; POSITRON ANNIHILATION; 9-PARAMETER; S/W PARAMETER; R PARAMETER; PHOTOLUMINESCENCE (PL); VACANCY; MOVPE; DEPTH PROFILE;
D O I
10.1143/JJAP.30.2442
中图分类号
O59 [应用物理学];
学科分类号
摘要
Defects in metalorganic chemical vapor deposition epitaxy (MOVPE)-grown ZnSe heteroepilayers on GaAs were investigated by monoenergetic positrons. The present work revealed clear differences between an as-grown specimen and a heat-treated one under different atmospheres. The as-grown specimen prepared at high temperature (350-degrees-C) showed a proliferation of a large number of defects near the surface and at the GaAs interface due to lattice mismatching and nonstoichiometry. Heat treatment at 70-degrees-C in N2 ambient introduced vacancies in high concentrations which contribute to the deep emission of photoluminescence. It is concluded that adequate heat treatment under zinc vapor is essential to reduce the concentration of native defects in MOVPE-grown ZnSe film on GaAs.
引用
收藏
页码:2442 / 2448
页数:7
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