3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY (II)

被引:5
作者
KURODA, K [1 ]
SUZUKI, T [1 ]
机构
[1] OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,YAMADA,OSAKA,JAPAN
关键词
D O I
10.1063/1.1655262
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:23 / 24
页数:2
相关论文
共 3 条
[1]  
Butler, 1966, 6TH P INT C EL MICR, V1, P191
[2]   3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE [J].
KURODA, K ;
EBISUI, H ;
SUZUKI, T .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (05) :2336-2342
[3]   ANALYSIS OF ACCELERATING LENS SYSTEM IN FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE [J].
KURODA, K ;
SUZUKI, T .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (03) :1436-1441