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3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY (II)
被引:5
作者
:
KURODA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,YAMADA,OSAKA,JAPAN
KURODA, K
[
1
]
SUZUKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,YAMADA,OSAKA,JAPAN
SUZUKI, T
[
1
]
机构
:
[1]
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,YAMADA,OSAKA,JAPAN
来源
:
APPLIED PHYSICS LETTERS
|
1974年
/ 25卷
/ 01期
关键词
:
D O I
:
10.1063/1.1655262
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:23 / 24
页数:2
相关论文
共 3 条
[1]
Butler, 1966, 6TH P INT C EL MICR, V1, P191
[2]
3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE
[J].
KURODA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
KURODA, K
;
EBISUI, H
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
EBISUI, H
;
SUZUKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
SUZUKI, T
.
JOURNAL OF APPLIED PHYSICS,
1974,
45
(05)
:2336
-2342
[3]
ANALYSIS OF ACCELERATING LENS SYSTEM IN FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE
[J].
KURODA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
KURODA, K
;
SUZUKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
SUZUKI, T
.
JOURNAL OF APPLIED PHYSICS,
1974,
45
(03)
:1436
-1441
←
1
→
共 3 条
[1]
Butler, 1966, 6TH P INT C EL MICR, V1, P191
[2]
3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE
[J].
KURODA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
KURODA, K
;
EBISUI, H
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
EBISUI, H
;
SUZUKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,YAMADA,OSAKA,JAPAN
SUZUKI, T
.
JOURNAL OF APPLIED PHYSICS,
1974,
45
(05)
:2336
-2342
[3]
ANALYSIS OF ACCELERATING LENS SYSTEM IN FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE
[J].
KURODA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
KURODA, K
;
SUZUKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
SUZUKI, T
.
JOURNAL OF APPLIED PHYSICS,
1974,
45
(03)
:1436
-1441
←
1
→