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DETERMINATION OF FUNNEL LENGTH FROM CROSS-SECTION VERSUS LET MEASUREMENTS
被引:28
作者
:
GOLKE, KW
论文数:
0
引用数:
0
h-index:
0
机构:
Honeywell SSEC MN14 - 2C15, Plymouth, MN, 55441
GOLKE, KW
机构
:
[1]
Honeywell SSEC MN14 - 2C15, Plymouth, MN, 55441
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1993年
/ 40卷
/ 06期
关键词
:
Charge carriers - Electric charge - Mathematical models - Substrates - Surface phenomena;
D O I
:
10.1109/23.273464
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
A method is proposed for determining the funnel length from heavy ion upset cross section versus LET data for bulk technologies having an epi layer.
引用
收藏
页码:1910 / 1917
页数:8
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[1]
DETERMINATION OF SEU PARAMETERS OF NMOS AND CMOS SRAMS
[J].
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Department of Physics and Astronomy, Clemson University
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
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:1463
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[2]
CHARGE COLLECTION MEASUREMENTS FOR HEAVY-IONS INCIDENT ON N-TYPE AND P-TYPE SILICON
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RATE PREDICTION FOR SINGLE EVENT EFFECTS - A CRITIQUE
[J].
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引用数:
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机构:
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
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MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
ADAMS, JH
;
SMITH, EC
论文数:
0
引用数:
0
h-index:
0
机构:
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
SMITH, EC
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1992,
39
(06)
:1577
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[4]
PETERSEN EL, 1993, JUL NSREC
←
1
→
共 4 条
[1]
DETERMINATION OF SEU PARAMETERS OF NMOS AND CMOS SRAMS
[J].
MCNULTY, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics and Astronomy, Clemson University
MCNULTY, PJ
;
BEAUVAIS, WJ
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics and Astronomy, Clemson University
BEAUVAIS, WJ
;
ROTH, DR
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics and Astronomy, Clemson University
ROTH, DR
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1991,
38
(06)
:1463
-1470
[2]
CHARGE COLLECTION MEASUREMENTS FOR HEAVY-IONS INCIDENT ON N-TYPE AND P-TYPE SILICON
[J].
OLDHAM, TR
论文数:
0
引用数:
0
h-index:
0
OLDHAM, TR
;
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
MCLEAN, FB
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1983,
30
(06)
:4493
-4500
[3]
RATE PREDICTION FOR SINGLE EVENT EFFECTS - A CRITIQUE
[J].
PETERSEN, EL
论文数:
0
引用数:
0
h-index:
0
机构:
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
PETERSEN, EL
;
PICKEL, JC
论文数:
0
引用数:
0
h-index:
0
机构:
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
PICKEL, JC
;
ADAMS, JH
论文数:
0
引用数:
0
h-index:
0
机构:
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
ADAMS, JH
;
SMITH, EC
论文数:
0
引用数:
0
h-index:
0
机构:
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121
SMITH, EC
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1992,
39
(06)
:1577
-1599
[4]
PETERSEN EL, 1993, JUL NSREC
←
1
→