THE RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER - COMPARISON OF EXPERIMENT AND THEORY

被引：23

作者：

LUCAS, CA

GARTSTEIN, E

COWLEY, RA

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1989年 / 45卷

关键词：

D O I：

10.1107/S010876738900108X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：416 / 422

页数：7

共 15 条

[1] X-RAY-SCATTERING FROM CRITICAL FLUCTUATIONS AND DOMAIN-WALLS IN KDP AND DKDP [J].

ANDREWS, SR ;

COWLEY, RA .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (04) :615-635

[2] SCATTERING OF X-RAYS FROM CRYSTAL-SURFACES [J].

ANDREWS, SR ;

COWLEY, RA .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (35) :6427-6439

[3] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J].

BATTERMAN, BW ;

COLE, H .

REVIEWS OF MODERN PHYSICS, 1964, 36 (03) :681-&

[4]

BJERRUMMOLLER H, 1970, INSTRUMENTATION NEUT, P49

[5] DERIVATION AND EXPERIMENTAL VERIFICATION OF NORMALIZED RESOLUTION FUNCTION FOR INELASTIC NEUTRON-SCATTERING [J].

CHESSER, NJ ;

AXE, JD .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (MAR1) :160-169

[6] RESOLUTION FUNCTION IN NEUTRON DIFFRACTOMETRY .I. RESOLUTION FUNCTION OF A NEUTRON DIFFRACTOMETER AND ITS APPLICATION TO PHONON MEASUREMENTS [J].

COOPER, MJ ;

NATHANS, R .

ACTA CRYSTALLOGRAPHICA, 1967, 23 :357-&

[7] X-RAY-SCATTERING STUDIES OF THIN-FILMS AND SURFACES - THERMAL OXIDES ON SILICON [J].

COWLEY, RA ;

RYAN, TW .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (01) :61-68

[8] RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER [J].

COWLEY, RA .

ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 :825-836

[9]

GARTSTEIN E, 1989, UNPUB

[10] THE RESOLUTION FUNCTION OF A PERFECT-CRYSTAL 3-AXIS X-RAY SPECTROMETER [J].

PYNN, R ;

FUJII, Y ;

SHIRANE, G .

ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (JAN) :38-46

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