ADSORPTION OF BORON ON SI(111) - PHYSICS, CHEMISTRY, AND ATOMIC-SCALE ELECTRONIC DEVICES

被引:77
作者
AVOURIS, P
LYO, IW
BOZSO, F
KAXIRAS, E
机构
[1] IBM Research Division, T. J. Watson Research Center, New York, 10598, Yorktown Heights
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 04期
关键词
D O I
10.1116/1.576522
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have used scanning tunneling microscopy, atom-resolved tunneling spectroscopy, and photoemission to investigate the interaction of B with Si (111). Using decaborane as the source of B, we have followed the structural and electronic modifications of the surface as a function of the annealing temperature. In the stable B/Si (111)-√3 X √3 surface, B occupies a novel configuration where it substitutes for a Si atom in the 3rd atomic layer directly below a Si adatom. Because of a Si-to-B charge transfer, the top Si adatom layer has no occupied dangling-bond states and is insulating. As a result, the chemical properties of Si adatoms on the B/Si (111)-√3 X √3 surface are very different from those of the adatoms on the Si(111) -7 × 7 surface. We find evidence for doping effects on chemistry that involve short-range direct dopant-reactive site interactions. Finally, we report on the electrical characteristics of localized defect sites on the B-doped Si surface. We found that I-V curves over such sites may show regions of negative differential resistance and that this behavior is localized in areas of atomic dimensions (~1 nm). We propose a model according to which the development of negative resistance requires the existance of narrow peaks at appropriate energies in the density of states spectra of both sample and tip. © 1990, American Vacuum Society. All rights reserved.
引用
收藏
页码:3405 / 3411
页数:7
相关论文
共 32 条
[1]   ATOM-RESOLVED SURFACE-CHEMISTRY USING THE SCANNING TUNNELING MICROSCOPE [J].
AVOURIS, P .
JOURNAL OF PHYSICAL CHEMISTRY, 1990, 94 (06) :2246-2256
[2]   ATOM-RESOLVED SURFACE-CHEMISTRY STUDIED BY SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY [J].
AVOURIS, P ;
WOLKOW, R .
PHYSICAL REVIEW B, 1989, 39 (08) :5091-5100
[3]   DEMONSTRATION OF THE TUNNEL-DIODE EFFECT ON AN ATOMIC SCALE [J].
BEDROSSIAN, P ;
CHEN, DM ;
MORTENSEN, K ;
GOLOVCHENKO, JA .
NATURE, 1989, 342 (6247) :258-260
[4]   SURFACE DOPING AND STABILIZATION OF SI(111) WITH BORON [J].
BEDROSSIAN, P ;
MEADE, RD ;
MORTENSEN, K ;
CHEN, DM ;
GOLOVCHENKO, JA ;
VANDERBILT, D .
PHYSICAL REVIEW LETTERS, 1989, 63 (12) :1257-1260
[5]   SCANNING TUNNELING MICROSCOPY - FROM BIRTH TO ADOLESCENCE [J].
BINNIG, G ;
ROHRER, H .
REVIEWS OF MODERN PHYSICS, 1987, 59 (03) :615-625
[6]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[7]   THERMAL AND ELECTRON-BEAM-INDUCED REACTION OF DISILANE ON SI(100)-(2X1) [J].
BOZSO, F ;
AVOURIS, P .
PHYSICAL REVIEW B, 1988, 38 (06) :3943-3947
[8]   NEW PHENOMENON IN NARROW GERMANIUM PARA-NORMAL-JUNCTIONS [J].
ESAKI, L .
PHYSICAL REVIEW, 1958, 109 (02) :603-604
[9]   POLARIZATION AND THE HALDANE-ANDERSON MODEL OF DEFECTS IN NONMETALS [J].
FOWLER, WB ;
ELLIOTT, RJ .
PHYSICAL REVIEW B, 1986, 34 (08) :5525-5529