ELECTROCHEMICAL FABRICATION OF SCANNING-TUNNELING-MICROSCOPY TIPS WITHOUT AN ELECTRONIC SHUTOFF CONTROL

被引：18

作者：

BOURQUE, H ^{[1
]}

LEBLANC, RM ^{[1
]}

机构：

[1] UNIV MIAMI,DEPT CHEM,CORAL GABLES,FL 33124

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 03期

关键词：

D O I：

10.1063/1.1145612

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report a modified procedure to fabricate electrochemically etched scanning tunneling microscopy tips under ac voltage. By both confining the etching action to a small region and controlling the etching current on a tungsten wire, we produce ultrasharp tips with low-aspect ratio. No electronic shut-off control is required. Atomic resolution images are routinely obtained. © 1995 American Institute of Physics.

引用

页码：2695 / 2697

页数：3

共 7 条

[1] ION MILLED TIPS FOR SCANNING TUNNELING MICROSCOPY [J].