SURFACE MEASUREMENTS ON FRESHLY CLEAVED SILICON PARA-NORMAL JUNCTIONS

被引：90

作者：

GOBELI, GW

ALLEN, FG

机构：

来源：

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1960年 / 14卷

关键词：

D O I：

10.1016/0022-3697(60)90201-8

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：23 / &

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