10-35 NANOSECOND MAGNETO-RESISTIVE MEMORIES

被引:6
作者
RANMUTHU, KTM
RANMUTHU, IW
POHM, AV
COMSTOCK, CS
HASSOUN, M
机构
[1] Electrical Engineering and Computer Engineering Engineering Research Institute, Iowa State University, Ames
关键词
D O I
10.1109/20.104787
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Magneto-resistive memory elements are being used to build non-volatile, random access, read-write memories which possess radiation hardness. In a typical M-R memory element, the modest output signal requires higher • access. times in order to maintain an adequate SNR, thus limiting the speed attainable. This limitation can be overcome by increasing the memory element size and using a reverse read word current together with suitable sense techniques. Large M-R memory cells with a sense resistance of about 470 a have been synthesized by stringing eight 1.8 x 12um M-R elements together. These were tested in a bridge formation to obtain signal levels as large as -11 mv and + 7 mv, with an approximate settling time of 35 ns in a discrete circuit. © 1990 IEEE
引用
收藏
页码:2532 / 2534
页数:3
相关论文
共 3 条
[1]   THE DESIGN OF A ONE MEGABIT NON-VOLATILE M-R MEMORY CHIP USING 1.5 X 5-MU-M CELLS [J].
POHM, AV ;
HUANG, JST ;
DAUGHTON, JM ;
KRAHN, DR ;
MEHRA, V .
IEEE TRANSACTIONS ON MAGNETICS, 1988, 24 (06) :3117-3119
[2]   ANALYSIS OF M-R ELEMENTS FOR 108 BIT/CM2 ARRAYS [J].
POHM, AV ;
COMSTOCK, CS ;
DAUGHTON, JM .
IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (05) :4266-4268
[3]  
POHM AV, 1989, NOV 3M C BOST