ATOMIC CHLORINE CONCENTRATION AND GAS TEMPERATURE-MEASUREMENTS IN A PLASMA-ETCHING REACTOR

被引:51
作者
WORMHOUDT, J [1 ]
STANTON, AC [1 ]
RICHARDS, AD [1 ]
SAWIN, HH [1 ]
机构
[1] MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
关键词
D O I
10.1063/1.338846
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:142 / 148
页数:7
相关论文
共 42 条
[1]  
BRUCE RH, 1985, J APPL PHYS, V58, P2135
[2]   COLLISIONAL QUENCHING OF CL(2P1/2) STUDIED BY FAST MAGNETIC-FIELD JUMP TIME-RESOLVED LASER MAGNETIC-RESONANCE [J].
CHICHININ, AI ;
KRASNOPEROV, LN .
CHEMICAL PHYSICS LETTERS, 1986, 124 (01) :8-13
[3]   COLLISIONAL QUENCHING OF ELECTRONICALLY EXCITED CHLORINE ATOMS, CL[3P5(2P1/2)], BY ATMOSPHERIC GASES STUDIED BY TIME-RESOLVED ATOMIC RESONANCE-ABSORPTION SPECTROSCOPY IN THE VACUUM ULTRAVIOLET [J].
CLARK, RH ;
HUSAIN, D .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1984, 80 :97-113
[4]   A SPECTROSCOPIC INVESTIGATION OF THE OCS DISCHARGE SYSTEM [J].
CLARK, WW ;
DELUCIA, FC .
JOURNAL OF CHEMICAL PHYSICS, 1981, 74 (06) :3139-3147
[5]  
CONDON EU, 1935, THEORY ATOMIC SPECTR, P238
[6]  
d'Agostino R., 1984, Plasma Chemistry and Plasma Processing, V4, P165, DOI 10.1007/BF00566839
[7]   REACTION OF ATOMIC AND MOLECULAR CHLORINE WITH ALUMINUM [J].
DANNER, DA ;
HESS, DW .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (03) :940-947
[8]  
DAVIS GP, 1983, J APPL PHYS, V54, P3080, DOI 10.1063/1.332514
[9]   LASER DIAGNOSTICS OF PLASMA-ETCHING - MEASUREMENT OF CL2+ IN A CHLORINE DISCHARGE [J].
DONNELLY, VM ;
FLAMM, DL ;
COLLINS, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (03) :817-823
[10]   ANISOTROPIC ETCHING OF SIO2 IN LOW-FREQUENCY CF4/O2 AND NF3/AR PLASMAS [J].
DONNELLY, VM ;
FLAMM, DL ;
DAUTREMONTSMITH, WC ;
WERDER, DJ .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (01) :242-252