PHOTOABLATION - SCHOTTKY BARRIERS ON PATTERNED SI SURFACES

被引:2
作者
GREBEL, H
FANG, KJ
机构
[1] Optical Waveguide Laboratory, Department of Electrical Engineering, New Jersey Institute of Technology, Newark
关键词
D O I
10.1063/1.359331
中图分类号
O59 [应用物理学];
学科分类号
摘要
Easy to make, patterned, Schottky barriers are investigated. In particular, the following aspects have been considered: the patterning technique, the electrical barrier height, and potential usage as solar cells. Patterning of the Si surfaces was achieved by photoablation process using an UV excimer laser in a presence of various solutions. Using a 5 mW red HeNe laser launched at various angles on the Si surface we have found that patterned solar cells ablated with 2:3:100 of HF:HNO3:H2O were as much as 23% more efficient than nonpatterned cells. © 1995 American Institute of Physics.
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页码:367 / 370
页数:4
相关论文
共 16 条
[1]  
Baraona C. R., 1975, 11th IEEE Photovoltaic Specialists Conference, P44
[2]   LIGHT TRAPPING PROPERTIES OF PYRAMIDALLY TEXTURED SURFACES [J].
CAMPBELL, P ;
GREEN, MA .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (01) :243-249
[3]   THEORETICAL-STUDIES OF TEXTURED AMORPHOUS-SILICON SOLAR-CELLS [J].
DERRICK, GH ;
MCPHEDRAN, RC ;
MCKENZIE, DR .
APPLIED OPTICS, 1986, 25 (20) :3690-3696
[4]  
Ehrlich D.J., 1989, LASER MICROFABRICATI
[5]   LASER-INDUCED ETCHING OF INP USING 2 LASER FREQUENCIES SIMULTANEOUSLY [J].
GREBEL, H ;
PIEN, P .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (05) :2428-2432
[6]  
GREBEL H, UNPUB
[7]   LASER-INDUCED CHEMICAL ETCHING OF SILICON IN CHLORINE ATMOSPHERE .3. COMBINED CW AND PULSED IRRADIATION [J].
KULLMER, R ;
BAUERLE, D .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 47 (04) :377-386
[8]   DIFFRACTION ANALYSIS OF DIELECTRIC SURFACE-RELIEF GRATINGS [J].
MOHARAM, MG ;
GAYLORD, TK .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (10) :1385-1392
[9]   TEXTURED BACK-SURFACE REFLECTORS FOR THIN-FILM SOLAR-CELLS [J].
PAULICK, TC .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :3016-3024
[10]   MICROSPECTROSCOPIC REFLECTANCE MEASUREMENTS OF TEXTURED POLYCRYSTALLINE SI SOLAR-CELLS BY SCANNING SPECTROREFLECTOMETER [J].
SHIMOKAWA, R ;
SAITO, I ;
KATORI, K ;
NAGAMINE, F ;
TSUBOI, H .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (03) :1540-1542